STEM operates by focusing a beam of electrons into a narrow probe that is scanned across a thin specimen. As the electrons interact with the sample, they are either scattered or transmitted. The ...

A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...

In the life sciences, cryogenic electron microscopy (cryo-EM) has revolutionized structure determination by providing atomic-resolution structures of biomolecules in their native environment and in ...

A home machinist and microscopy enthusiast has documented a detailed technical conversion of a ...

Scanning electron microscopy (SEM) has become an indispensable tool in nanometrology by combining high-resolution imaging with surface-sensitive contrast mechanisms. Utilising interactions between a ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

In this interview, News Medical speaks with Rhea Stringer, Electron Microscopist at the John Innes Centre, about the role of electron microscopy in biological imaging. Rhea discusses how advanced ...

If you want to build semiconductors at home, it seems like the best place to start might be to find a used scanning electron microscope on eBay. At least that’s how [Peter Bosch] kicked off his ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Tim McCoy (right), the Smithsonian’s National Museum of Natural History curator of meteorites and the co-lead author on the new paper, with Cari Corrigan (left) sein a scanning electron microscopy lab ...